FAQ

Hardware stress test

Known as: Stress test, Stress test (hardware) 
Stress test (sometimes called a torture test) is a form of deliberately intense and thorough testing used to determine the stability of a given… (More)
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Topic mentions per year

Topic mentions per year

1978-2018
0102019782018

Related topics

Related topics

16 relations
Burn-inCPU core voltageCentral processing unitClock rate
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Related mentions per year

Related mentions per year

1937-2018
19401960198020002020
Hardware stress test
Central processing unit
Distributed computing
Clock rate
Reliability engineering
Crash (computing)

Papers overview

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2015
2015
Commercialization and reliability of 600 V GaN power switches
The reliability of 600 V GaN power switches, fabricated in a silicon CMOS foundry, has been demonstrated. JEDEC qualification of… (More)
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2013
2013
Introducing FIRESTARTER: A processor stress test utility
Processor stress test utilities are important tools for a number of different use cases. In particular, cooling systems need to… (More)
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2012
2012
A Data Mining Approach for Prediction of Heart Disease Using Neural Networks
Heart disease diagnosis is a complex task which requires much experience and knowledge. Traditional way of predicting Heart… (More)
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2011
2011
Valuing the Treasury's Capital Assistance Program
The Capital Assistance Program (CAP) was created by the U.S. government in February 2009 to provide backup capital to large… (More)
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2010
2010
A systematic approach to multi-period stress testing of portfolio credit risk
We propose a new method for analysing multi-period stress scenarios for portfolio credit risk more systematically than in current… (More)
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2008
2008
Empirical analysis of a genetic algorithm-based stress test technique
Evolutionary testing denotes the use of evolutionary algorithms, e.g., Genetic Algorithms (GAs), to support various test… (More)
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2008
2008
Traffic-aware stress testing of distributed real-time systems based on UML models using genetic algorithms
This paper presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network… (More)
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2005
2005
Vagal Stimulation and Prevention of Sudden Death
a chronically implantable device to be placed around the cervical right vagus. An anterior myocardial infarction was produced in… (More)
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2005
2005
Influence of bump geometry, adhesives and pad finishings on the joint resistance of Au bump and A/NCA flip chip interconnection
Flip chip assembly using non-conductive adhesives (NCAs) and anisotropic conductive adhesives (ACAs) is gaining importance and… (More)
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1979
1979
Lucky-electron model of channel hot electron emission
  • Chenming Hu
  • 1979 International Electron Devices Meeting
  • 1979
The lucky electron model proposes that an electron is emitted into SiO2by first gaining enough energy without suffering an energy… (More)
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