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Automated X-ray inspection
Known as:
AXI
Automated X-ray inspection (AXI) is a technology based on the same principles as automated optical inspection (AOI). It uses X-rays as its source…
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Related topics
Related topics
9 relations
5DX
Acceptance testing
Automated optical inspection
Ball grid array
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Design of a pre-scheduled data bus for advanced encryption standard encrypted system-on-chips
Xiaokun Yang
,
Wujie Wen
Asia and South Pacific Design Automation…
2017
Corpus ID: 353111
This paper proposes a high efficiency data bus (DBUS) for Advanced Encryption Standard (AES) encrypted system-on-chips (SoCs…
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2014
2014
Adaptive Reference Image Set Selection in Automated X-Ray Inspection
Xinhua Xiao
,
A. Ferro
,
Tao Ma
,
C. Han
,
Xuefu Zhou
,
W. Wee
Journal of Electrical and Computer Engineering
2014
Corpus ID: 37629127
The automatic radioscopic inspection of industrial parts usually uses reference based methods. These methods select, as benchmark…
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2010
2010
A High-Performance Network Interface Architecture for NoCs Using Reorder Buffer Sharing
M. Ebrahimi
,
M. Daneshtalab
,
P. Liljeberg
,
J. Plosila
,
H. Tenhunen
18th Euromicro Conference on Parallel…
2010
Corpus ID: 14422939
Increasing memory parallelism in MPSoCs to provide higher memory bandwidth is achieved by accessing multiple memories…
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2007
2007
Automated X‐ray inspection method for fillet‐less mounted chip components
A. Teramoto
,
T. Murakoshi
,
M. Tsuzaka
,
H. Fujita
2007
Corpus ID: 91172687
Chip components mounted on the printed circuit board are rapidly being miniaturized. Furthermore, the fillet‐less chip soldering…
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2007
2007
Automated Solder Inspection Method by Means of X-ray Oblique Computed Tomography
A. Teramoto
,
T. Murakoshi
,
M. Tsuzaka
,
H. Fujita
IEEE International Conference on Image Processing
2007
Corpus ID: 14582041
High-density LSI packages such as ball grid array (BGA) are being utilised in the car electronics and communications…
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2007
2007
NISAR: An AXI compliant on-chip NI architecture offering transaction reordering processing
Xu Yang
,
Zhang Qing-li
,
Fu Fang-fa
,
Yu Ming-yan
,
Liu Cheng
International Conference on ASIC
2007
Corpus ID: 36813091
In this paper, we present an AXI compliant Network Interface (NI) for NoC, which can deal with the reordering problem and support…
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2005
2005
Development of an automated X-ray inspection method for microsolder bumps
A. Teramoto
,
T. Murakoshi
,
M. Tsuzaka
,
H. Fujita
International Symposium on Electronics Materials…
2005
Corpus ID: 38478331
BGA, CSP, and flip-chip packages are widely used in printed circuit boards. These packages use an array of solder bumps as the…
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2001
2001
The Why , Where , What , How , and When of Automated X-ray Inspection By
Glen Leinbach
,
S. Oresjo
2001
Corpus ID: 37705386
Use of automated X-ray inspection (AXI) for printed circuit board inspection is rapidly growing, especially on high-density…
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1997
1997
Edge-texture wavelet features for automated x-ray inspection
H. Szu
,
Charles Hsu
Defense, Security, and Sensing
1997
Corpus ID: 120926731
Computer aided target recognition (ATR) is introduced to reduce the false alarm rate (FAR) based on a pair of x-ray images. We…
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1966
1966
A round spore character in N. crassa
M. B. Mitchell
1966
Corpus ID: 55238448
Round spore character in N. crassa Creative Commons License This work is licensed under a Creative Commons Attribution-Share…
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