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ABCD1 protein, human
Known as:
ALDP protein, human
, X-ALD protein, human
, X-ALD protein
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National Institutes of Health
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Related topics
Related topics
2 relations
ABCD1 gene
Broader (1)
ATP-Binding Cassette Transporters
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
GaSb Inversion-Mode PMOSFETs With Atomic-Layer-Deposited Al 2 O 3 as Gate Dielectric
Min Xu
2017
Corpus ID: 28087359
GaSb inversion-mode PMOSFETs with atomiclayer-deposited (ALD) Al2O3 as gate dielectric are demonstrated. A 0.75-μm-gate-length…
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2015
2015
Micromechanical characterization of ALD thin films
M. Berdova
2015
Corpus ID: 26305219
Aalto University, P.O. Box 11000, FI-00076 Aalto www.aalto.fi Author Maria Berdova Name of the doctoral dissertation…
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2014
2014
Implementation of an ALD-Al2O3 PERC-Technology into a Multi- and Monocrystalline Industrial Pilot Production
D. Pysch
,
C. Schmitt
,
+17 authors
H. Heezen
2014
Corpus ID: 138491900
2013
2013
Improving high-capacity Li 1 . 2 Ni 0 . 15 Mn 0 . 55 Co 0 . 1 O 2-based lithium-ion cells by modi fi ying the positive electrode with alumina
M. Bettge
,
Yan Li
,
+5 authors
Daniel P. Abrahama
2013
Corpus ID: 36098791
< Positive electrodes in Li-ion fullcells are modified by thin Al2O3 coatings and alumina powder. < ALD-Al2O3 coatings (<4 nm…
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2012
2012
Flexible and Conformal Thermal Ground Planes
C. Oshman
,
Qian Li
,
+7 authors
Ronggui Yang
2012
Corpus ID: 29337598
Abstract : We report novel flexible thermal ground planes (FTGPs) based on heat pipe technology. FTGP's effective thermal…
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2011
2011
GaSb Inversion-Mode PMOSFETs With Atomic-Layer-Deposited Al 2 O 3 as Gate Dielectric
Min Xu
,
Runsheng Wang
,
P. Ye
2011
Corpus ID: 180257232
GaSb inversion-mode PMOSFETs with atomiclayer-deposited (ALD) Al2O3 as gate dielectric are demonstrated. A 0.75-μm-gate-length…
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2006
2006
Characteristics of SiO 2 Film Grown by Atomic Layer Deposition as the Gate Insulator of Low-Temperature Polysilicon Thin-Film Transistors
Won-Jun Lee
,
Minkyu Chun
,
+4 authors
S. Rha
2006
Corpus ID: 10165807
SiO2 films were prepared by atomic layer deposition (ALD) technique, and their physical and electrical properties were…
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2006
2006
Dielectric Relaxation of ALD HfO2 Thin Films from 1 kHz to 5 GHz
Byungjoo Lee
,
Taeho Moon
,
Taegon Kim
,
D. Choi
,
Byungwoo Park
2006
Corpus ID: 113557414
Review
2004
Review
2004
Opportunities and challenges for high-k gate dielectrics
T. Ma
International Symposium on the Physical and…
2004
Corpus ID: 110020612
Some key issues related to the development of high-k dielectric technology, including gate stack processing, formation of…
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1988
1988
A New Device Structure Utilizing Atomic Layer Doping (ALD) Technology in Si Systems
K. Yamaguchi
,
K. Nakagawa
,
Y. Shiraki
1988
Corpus ID: 73600357
A new device structure utilizing an Atomic Layer Doping (ALD) technology in Si systems is presented. The ALD technology enables…
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