• Corpus ID: 30884640

chronology of deposition of natural fi ngermarks and inks on paper using secondary ion mass spectrometry

@inproceedings{AttardMontalto2014chronologyOD,
  title={chronology of deposition of natural fi ngermarks and inks on paper using secondary ion mass spectrometry},
  author={Nicola Attard-Montalto and Jes{\'u}s J. Ojeda and Alan Reynolds and Mahado Ismail and Melanie Jane Bailey and Lisette Doodkorte and Marcel de Puitc and B. JonesD.},
  year={2014}
}
This study thoroughly explores the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fingermarks and ink on a porous paper surface. Our experimental work has demonstrated that mapping selected endogenous components present in natural fingermarks enables the observation of friction ridges on a laser-printed surface, only when a fingerprint is deposited over this layer of ink. Further investigations have shown limited success on ink-jet… 

References

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A new protocol using time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been developed to identify the deposition order of a fingerprint overlapping an ink line on paper, which gives an inconclusive result for one donor.

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