XPS depth profiling of oxide scales of stainless steels formed in high‐temperature aqueous conditions

@article{Ignatova2006XPSDP,
  title={XPS depth profiling of oxide scales of stainless steels formed in high‐temperature aqueous conditions},
  author={V. Ignatova and S. Dyck and R. Gr{\"o}tzschel and W. M{\"o}ller},
  journal={Surface and Interface Analysis},
  year={2006},
  volume={38},
  pages={396-400}
}
In this work, we studied the oxide scales of AISI 304 and AISI 316 stainless steels formed under high-temperature aqueous conditions using X-ray photoelectron spectroscopy (XPS) together with sputter depth profiling. Two samples of SS 304 and 316 were prepared by exposing them to water at 300 °C containing 100 ppm boric acid and 7 ppm lithium hydroxide in an autoclave. In the case of sputtering with 3 keV argon ions, the elemental distribution as a function of the sputtering time was… Expand
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