XAFS in dilute magnetic semiconductors.

Abstract

X-Ray absorption fine structure (XAFS) spectroscopy has experienced a rapid development in the last four decades and has proved to be a powerful structure characterization technique in the study of local environments in condensed matter. In this article, we first introduce the XAFS basic principles including theory, data analysis and experiment in some… (More)
DOI: 10.1039/c3dt50888a

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@article{Sun2013XAFSID, title={XAFS in dilute magnetic semiconductors.}, author={Zhihu Sun and Wensheng Yan and Tao Yao and QingHua Liu and Yi Xie and Shiqiang Wei}, journal={Dalton transactions}, year={2013}, volume={42 38}, pages={13779-801} }