X-ray photoelectron spectroscopy surface analysis of aluminum ion stress in barley roots.

@article{Millard1990XrayPS,
  title={X-ray photoelectron spectroscopy surface analysis of aluminum ion stress in barley roots.},
  author={M. Millard and C. Foy and C. A. Coradetti and M. Reinsel},
  journal={Plant physiology},
  year={1990},
  volume={93 2},
  pages={
          578-83
        }
}
X-ray photoelectron spectroscopy (XPS) has been used to analyze root surface changes when Dayton barley (Hordeum vulgare) (Al tolerant) and Kearney barley (Al sensitive) seedlings were grown in nutrient solution in the presence and absence of 37.0 micromolar Al. The electron spectra from root surfaces contained strong lines in order of decreasing intensity from organic forms of carbon, oxygen, and nitrogen and weak lines due to inorganic elements in the form of anions and cations on the surface… Expand
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