X-ray particle image velocimetry for measuring quantitative flow information inside opaque objects

@article{Lee2003XrayPI,
  title={X-ray particle image velocimetry for measuring quantitative flow information inside opaque objects},
  author={S. Lee and Guk-Bae Kim},
  journal={Journal of Applied Physics},
  year={2003},
  volume={94},
  pages={3620-3623}
}
An x-ray particle image velocimetry (PIV) technique was developed to measure quantitative information on flows inside opaque objects. To acquire x-ray images suitable for PIV velocity field measurements, refraction-based edge enhancement was employed using detectable tracer particles with the object and detector separated by an experimentally determined optimal distance. The x-ray PIV method was applied to a flow in an opaque Teflon tube. The resulting amassed velocity field data were in… Expand
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