• Corpus ID: 119306461

X-ray-induced photoemission yield for surface studies of solids beyond the photoelectron escape depth

@article{Stoupin2016XrayinducedPY,
  title={X-ray-induced photoemission yield for surface studies of solids beyond the photoelectron escape depth},
  author={S Stoupin and Bing Shi and Mikhail Zhernenkov},
  journal={arXiv: Instrumentation and Detectors},
  year={2016}
}
X-ray-induced photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. This general statement should be complemented with exceptions arising from the distribution of the X-ray wavefield in the material. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure with the signal originating well below the photoelectron escape depth… 

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