X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR

@article{Touba2007XcancelingM,
  title={X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR},
  author={Nur A. Touba},
  journal={2007 IEEE International Test Conference},
  year={2007},
  pages={1-10}
}
A new X-tolerant multiple-input signature register (MISR) compaction methodology is proposed which can compact output streams containing unknown (X) values. Unlike conventional X-masking approaches, it does not require any masking logic at the input of the MISR. Instead it uses symbolic simulation to express each bit of the MISR signature as a linear equation in terms of the X's. Linearly dependent combinations of the signature bits are identified with Gaussian elimination and XORed together… CONTINUE READING
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References

Publications referenced by this paper.
Showing 1-10 of 19 references

X-Press Compactor for 1000x Reduction of Test Data

2006 IEEE International Test Conference • 2006

Finite memory test response compactors for embedded test applications

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems • 2005

X-compact: an efficient response compaction technique

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems • 2004

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