X-Ray structural characterization of larger CdSe semiconductor clusters

@inproceedings{Bawendi1989XRaySC,
  title={X-Ray structural characterization of larger CdSe semiconductor clusters},
  author={Moungi G Bawendi and A. Refik Kortan and Michael Louis Steigerwald and Louis E Brus},
  year={1989}
}
X‐ray powder patterns obtained from three different types of 35–40 A CdSe nanoclusters are analyzed. We simulate the effects of thermal fluctuations, stacking faults, surface reconstructions, and bond compressions on powder patterns of CdSe clusters using the Debye formula. We find that the spectra of capped and annealed CdSe particles grown in inverse micelles are best fit by a mixture of crystalline structures intermediate between zinc‐blende and wurtzite. We describe a new preparation for… CONTINUE READING

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