X-RAY DIFFRACTION CHARACTERIZATION OF RESIDUAL STRESSES PRODUCED BY SHOT PEENING

@inproceedings{Prevy1990XRAYDC,
  title={X-RAY DIFFRACTION CHARACTERIZATION OF RESIDUAL STRESSES PRODUCED BY SHOT PEENING},
  author={Paul S. Prev{\'e}y},
  year={1990}
}
A brief overview of the theory and practice of x-ray diffraction residual stress measurement as applied to shot peened materials is presented. The unique ability of x-ray diffraction methods to determine both the macroscopic residual stress and the depth and magnitude of the cold worked layer produced by shot peening is described. The need to obtain a complete description of the subsurface residual stress distribution, in order to accurately characterize the residual stress distributions… CONTINUE READING

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