Whiskers in indium tin oxide films obtained by electron beam evaporation

@inproceedings{Castaeda1998WhiskersII,
  title={Whiskers in indium tin oxide films obtained by electron beam evaporation},
  author={Santos Casta{\~n}eda and Fernando Orden Rueda and R. Dı́az and Jose Mar{\'i}a Ripalda and I. Monteroc},
  year={1998}
}
Indium tin oxide thin films consisting mainly of whiskers have been deposited on glass by electron beam evaporation. Low deposition rates ~35 Å/min! and substrate temperatures in the 120–400 °C range were used. Morphology by scanning electron microscopy, crystal structure, energy dispersive analysis of x-rays, and x-ray photoelectron spectroscopy compositions, optical and conducting properties of films have been studied as a function of temperature of growth and further annealing in air… CONTINUE READING