Weak Cell Detection in Deep-Submicron SRAMs: A Programmable Detection Technique

  title={Weak Cell Detection in Deep-Submicron SRAMs: A Programmable Detection Technique},
  author={Alexander I. Pavlov and M.. Sachdev and Jos{\'e} Pineda de Gyvez},
  journal={IEEE Journal of Solid-State Circuits},
Embedded SRAM bit count is constantly growing limiting yield in systems-on-chip (SoCs). As technology scales into deep sub-100-nm feature sizes, the increased defect density and process spreads make stability of embedded SRAMs a major concern. This paper introduces a digitally programmable detection technique, which enables detection of SRAM cells with compromised stability [with data retention faults (DRFs) being a subset]. The technique utilizes a set of cells to modify the bitline voltage… CONTINUE READING
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