VirtualScan: a new compressed scan technology for test cost reduction

@article{Wang2004VirtualScanAN,
  title={VirtualScan: a new compressed scan technology for test cost reduction},
  author={Laung-Terng Wang and Khader S. Abdel-Hafez and Shianling Wu and X. Wen and H. Furukawa and Fei-Sheng Hsu and Shyh-Horng Lin and Sen-Wei Tsai},
  journal={2004 International Conferce on Test},
  year={2004},
  pages={916-925}
}
This work describes the VirtualScan technology for scan test cost reduction. Scan chains in a VirtualScan circuit are split into shorter ones and the gap between external scan ports and internal scan chains are bridged with a broadcaster and a compactor. Test patterns for a VirtualScan circuit are generated directly by one-pass VirtualScan ATPG, in which multi-capture clocking and maximum test compaction are supported. In addition, VirtualScan ATPG avoids unknown-value and aliasing effects… Expand
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