The VideoAFM provides a 1000 fold increase in image rate compared to conventional atomic force microscopes, giving nanometre resolution images of surfaces at a rate of 15 frames s(-1), which is approximately 1 million pixels s(-1). Images of high stiffness surfaces such as calibration grids are provided for the first time, and allow for a more rigorous… (More)
Fig. 1 (a) VideoAFM image, collected in 33.3 ms (15 frames s21), and the corresponding conventional AFM topographic image, (b), collected in 85 s, of a silicon oxide calibration grid. (b) Software zoom from a slightly larger (4 mm) image. The white horizontal and vertical lines indicate the position of line profiles shown in Fig. 3, the arrows indicate the position of the background line profile in Fig. 3. In (b) black to white represents a change in height of 45 nm. The scale bar represents 1 mm.