Video rate Atomic Force Microscopy (AFM) imaging using compressive sensing

  title={Video rate Atomic Force Microscopy (AFM) imaging using compressive sensing},
  author={Bo Song and Ning Xi and Ruiguo Yang and King Wai Chiu Lai and Chengeng Qu},
  journal={2011 11th IEEE International Conference on Nanotechnology},
Atomic Force Microscopy (AFM) is a powerful tool for nano-size imaging. The advantage of AFM is that it can get extraordinary high resolution image at atom level. However, AFM obtains the sample topography image through scanning on the top of sample line by line, therefore it takes couples minutes to get an image and this negative point makes it difficult to continuously observe surface change during manipulation. In this paper, a novel approach for compressive sensing based video rate AFM… CONTINUE READING
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