Verification and Analysis of Self-Checking Properties through ATPG

@article{Hunger2008VerificationAA,
  title={Verification and Analysis of Self-Checking Properties through ATPG},
  author={Marc Hunger and Sybille Hellebrand},
  journal={2008 14th IEEE International On-Line Testing Symposium},
  year={2008},
  pages={25-30}
}
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect and compensate errors online. However, during synthesis and optimization self-checking… CONTINUE READING

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References

Publications referenced by this paper.
SHOWING 1-10 OF 15 REFERENCES

Soft errors in advanced computer systems

  • IEEE Design & Test of Computers
  • 2005
VIEW 1 EXCERPT

Modeling the effect of technology trends on the soft error rate of combinational logic

G. Metze
  • Proc . Int . Conf . on Dependable Systems and Networks
  • 2002