Velocity dependent friction laws in contact mode atomic force microscopy.

@article{Stark2004VelocityDF,
  title={Velocity dependent friction laws in contact mode atomic force microscopy.},
  author={Robert W. Stark and Georg Schitter and Andreas Stemmer},
  journal={Ultramicroscopy},
  year={2004},
  volume={100 3-4},
  pages={309-17}
}
Friction forces in the tip-sample contact govern the dynamics of contact mode atomic force microscopy. In ambient conditions typical contact radii between tip and sample are in the order of a few nanometers. In order to account for the large interaction area the dynamics of contact mode atomic force microscope (AFM) is investigated under the assumption of a multi-asperity contact interface between tip and sample. Thus, the kinetic friction force between tip and sample is the product of the real… CONTINUE READING