Variation-Aware System-Level Power Analysis

@article{Chandra2010VariationAwareSP,
  title={Variation-Aware System-Level Power Analysis},
  author={Saumya Chandra and Kanishka Lahiri and Anand Raghunathan and Sujit Dey},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2010},
  volume={18},
  pages={1173-1184}
}
The operational characteristics of integrated circuits in nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufacturing process and the operating environment. In this paper, we address the problem of incorporating the effects of variations into system-level power analysis tools. We consider both manufacturing-induced (die-to-die and within-die) variations in device characteristics, and operation-induced dynamic variations in on-chip temperature… CONTINUE READING

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