Variable-temperature microcrystal X-ray diffraction studies of negative thermal expansion in the pure silica zeolite IFR.

Abstract

Variable-temperature single-crystal X-ray diffraction using a synchrotron X-ray source has allowed the mechanism of negative thermal expansion in the pure silica zeolite IFR to be studied in greater detail than was previously possible over the temperature range 30-557 K. The results have allowed the changes in average atomic position with temperature to be… (More)

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