Validation of the measurement model concept for error structure identification

Abstract

The development of different forms of measurement models for impedance has allowed examination of key assumptions on which the use of such models to assess error structure are based. The stochastic error structures obtained using the transfer-function and Voigt measurement models were identical, even when non-stationary phenomena caused some of the data to… (More)

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@inproceedings{Shukla2004ValidationOT, title={Validation of the measurement model concept for error structure identification}, author={Pavan Kumar Shukla and Mark E. Orazem and Oscar D. Crisalle}, year={2004} }