Utilizing Circuit Structure for Scan Chain Diagnosis

Abstract

Scan chain diagnosis has become a critical issue to yield loss in modern technology. In this paper, we present a scan chain partitioning algorithm and a scan chain reordering algorithm to improve scan chain fault diagnosis resolution. In our scan chain partition algorithm, we take into consideration not only logic dependency but also the controllability… (More)
DOI: 10.1109/ETS.2013.6569355

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Citation Velocity: 8

Averaging 8 citations per year over the last 3 years.

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