Using the Berlekamp-Massey algorithm to obtain LFSR characteristic polynomials for TPG

@article{Acevedo2012UsingTB,
  title={Using the Berlekamp-Massey algorithm to obtain LFSR characteristic polynomials for TPG},
  author={Oscar Acevedo and Dimitrios Kagaris},
  journal={2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)},
  year={2012},
  pages={233-238}
}
In built-in test pattern generation, a test cube is usually encoded or compressed by a seed vector that is used as the initial state of a Linear Feedback Shift Register (LFSR). The seed vector is found by solving a linear system of equations using a fixed (but arbitrarily chosen) characteristic polynomial for the LFSR In contrast, finding the LFSR characteristic polynomial to generate a given test cube provides more design freedom but results in a non-linear system of equations. In this paper… CONTINUE READING