Using tag-match comparators for detecting soft errors

Abstract

Soft errors caused by high energy particle strikes are becoming an increasingly important problem in microprocessor design. With increasing transistor density and die sizes, soft errors are expected to be a larger problem in the near future. Recovering from these unexpected faults may be possible by reexecuting some part of the program only if the error can… (More)
DOI: 10.1109/L-CA.2007.14

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