Using process topology in plant-wide control loop performance assessment

@article{Yim2006UsingPT,
  title={Using process topology in plant-wide control loop performance assessment},
  author={S. Y. Yim and H. G. Ananthakumar and Lamia Benabbas and A. Horch and R. Drath and Nina F. Thornhill},
  journal={Computers & Chemical Engineering},
  year={2006},
  volume={31},
  pages={86-99}
}
This contribution describes how disturbances in a control system can be isolated and diagnosed automatically based on plant topology. In order to demonstrate this, a prototype software has been designed and implemented which, when given an electronic process schematic of a plant and results from a data-driven analysis, allows the user to pose queries about… CONTINUE READING