Using heavy-ion radiation to validate fault-handling mechanisms

  title={Using heavy-ion radiation to validate fault-handling mechanisms},
  author={Johan Karlsson and Peter Lid{\'e}n and Peter Dahlgren and Rolf Johansson and Ulf Gunneflo},
  journal={IEEE Micro},
Fault injection is an effective method for studying the effects of faults in computer systems and for validating fault-handling mechanisms. The approach presented involves injecting transient faults into integrated circuits by using heavy-ion radiation from a Californium-252 source. The proliferation of safety-critical and fault-tolerant systems using VLSI technology makes such attempts to inject faults at internal locations in VLSI circuits increasingly important.<<ETX>> 
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