Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics

@article{Wang2005UsingBS,
  title={Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics},
  author={Zhanglei Wang and Krishnendu Chakrabarty},
  journal={IEEE International Conference on Test, 2005.},
  year={2005},
  pages={10 pp.-486}
}
We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically-assembled electronic nanotechnology. Several fault detection configurations are presented to target stuck-at faults, shorts, opens, and connection faults in nanoblocks and switchblocks. We also present an adaptive recovery procedure through which we can identify defect-free nanoblocks and switchblocks in the nanofabric-under-test. The proposed BIST, recovery, and defect tolerance procedures are based… CONTINUE READING
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