Using Bulk Built-in Current Sensors to Detect Soft Errors

@article{Neto2006UsingBB,
  title={Using Bulk Built-in Current Sensors to Detect Soft Errors},
  author={Egas Henes Neto and Ivandro Ribeiro and Michele G. Vieira and Gilson I. Wirth and Fernanda Gusm{\~a}o de Lima Kastensmidt},
  journal={IEEE Micro},
  year={2006},
  volume={26},
  pages={10-18}
}
Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption 
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