Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal.

@article{Whitehead2006UseOT,
  title={Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal.},
  author={Kathryn A Whitehead and Dale Rogers and John S Colligon and Chris Wright and Joanna Verran},
  journal={Colloids and surfaces. B, Biointerfaces},
  year={2006},
  volume={51 1},
  pages={44-53}
}
The ease of removal of differently sized and shaped bacteria from substrata with defined surface topographies and features was investigated. Surfaces with defined surface topography (smooth or with randomly spaced surface features (pits) of 0.5 microm diameter), chemistry (titanium oxide), and wettability (89-93 degrees) were produced. Atomic force microscopy (AFM) was used to determine the ease of bacterial removal from substrata; gram negative Pseudomonas aeruginosa (rods 1 microm width x 3… CONTINUE READING