Use of low-temperature field emission scanning electron microscopy to examine mites.

@article{Wergin2000UseOL,
  title={Use of low-temperature field emission scanning electron microscopy to examine mites.},
  author={W. Wergin and Ra{\'u}l E Ramos Ochoa and Eric F. Erbe and Charnie Craemer and Arun K. Raina},
  journal={Scanning},
  year={2000},
  volume={22 3},
  pages={
          145-55
        }
}
Partly because mites are microscopic in size and fragile in nature, acarologists estimate that less than five percent of extant species have been taxonomically described. Recently, data from conventional scanning electron microscopy (SEM) have been used to facilitate the descriptions and complement the information that has been historically obtained with the light microscope. However, the conventional preparation techniques associated with SEM frequently prevent or compromise the results. This… CONTINUE READING

From This Paper

Topics from this paper.

Citations

Publications citing this paper.
SHOWING 1-10 OF 10 CITATIONS

Similar Papers

Loading similar papers…