Up Simulations for the FNAL MI for a Mixed Fill Pattern : Dependence on Peak SEY and Pulse Intensity During the Ramp Permalink

@inproceedings{Furman2011UpSF,
  title={Up Simulations for the FNAL MI for a Mixed Fill Pattern : Dependence on Peak SEY and Pulse Intensity During the Ramp Permalink},
  author={Miguel A. Furman},
  year={2011}
}
We present simulation results of the build-up of the electron-cloud density ne in three regions of the FNAL Main Injector (MI) for a beam fill pattern made up of 5 double booster batches followed by a 6th single batch. We vary the pulse intensity in the rangeNt = (2−5)×10, and the beam kinetic energy in the range Ek = 8 − 120 GeV. We assume a secondary electron emission model qualitatively corresponding to TiN, except that we let the peak value of the secondary electron yield (SEY) δmax vary as… CONTINUE READING

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