Universality of non-Ohmic shunt leakage in thin-film solar cells

Abstract

S. Dongaonkar, J. D. Servaites, G. M. Ford, S. Loser, J. Moore, R. M. Gelfand, H. Mohseni, H. W. Hillhouse, R. Agrawal, M. A. Ratner, T. J. Marks, M. S. Lundstrom, and M. A. Alam School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA School of Chemical Engineering, Purdue University, West Lafayette, Indiana 47907, USA Department of Chemistry, Northwestern University, Evanston, Illinois 60208, USA Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, Illinois 60208, USA The Argonne-Northwestern Solar Energy Research Center, Northwestern University, Evanston, Illinois 60208, USA

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Cite this paper

@inproceedings{Dongaonkar2010UniversalityON, title={Universality of non-Ohmic shunt leakage in thin-film solar cells}, author={Sourabh Dongaonkar and Jonathan D. Servaites and Gregory M. Ford and Ryan. M. Gelfand and Muhammad A. Alam and S. Dongaonkar and Stephen Loser and Jim Moore and Hooman Mohseni and Hugh W. Hillhouse and Rakesh Agrawal and Mark Ratner and Tobin J Marks and Mark S. Lundstrom and M. Ashraful Alam}, year={2010} }