Universal Test Sets for Multiple Fault Detection in AND-EXOR Arrays

Abstract

The fault-detection problem in AND-EXOR arrays is formulated in a new framework. The arrays considered are more general compared to those by the previous researchers. Designs of fault-detecting test sets to detect all multiple faults in these networks are presented. The designs are independent of the function realized and hence can be generated easily. 
DOI: 10.1109/TC.1978.1675057

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Cite this paper

@article{Pradhan1978UniversalTS, title={Universal Test Sets for Multiple Fault Detection in AND-EXOR Arrays}, author={Dhiraj K. Pradhan}, journal={IEEE Transactions on Computers}, year={1978}, volume={C-27}, pages={181-187} }