Unintrusive aging analysis based on offline learning

  title={Unintrusive aging analysis based on offline learning},
  author={Frank Sill and Pedro Fausto Rodrigues Leite and Rolf Drechsler},
  journal={2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)},
Runtime aging analysis of integrated circuits enables adaptive approaches in order to enhance the system's life time and permits the user to be aware of critical states. Common approaches utilize sensors that are integrated invasively into critical paths or report experienced aging. This work presents a lightweight supportive technique that correlates… CONTINUE READING