Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)

  title={Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)},
  author={T. Ben Britton and James L R Hickey},
  journal={IOP Conference Series: Materials Science and Engineering},
  • T. B. Britton, J. Hickey
  • Published 8 September 2017
  • Materials Science
  • IOP Conference Series: Materials Science and Engineering
High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to ‘conventional’ Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative misorientations of 1 x 10−4 rads (~ 0.006°) and changes in (deviatoric) lattice strain with a precision of 1 x 10−4. This is achieved through direct comparison of two or more diffraction patterns using sophisticated cross-correlation based image analysis routines… 

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