Understanding B-Site Disorder in HAADF-STEM Images of Double Perovskite Thin Films Using the Quantum Excitation of Phonons Model

Abstract

Advances in aberration corrected scanning transmission electron microscopy (STEM) have allowed for sub-Ångstrom probes and atomic resolution imaging. High-angle annular dark-field (HAADF) STEM produces images with contrast related to the average atomic number (Z) of the species in a given column, which can be useful in characterizing local ordering… (More)

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