Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy.

@article{Giannuzzi2007TwodimensionalA3,
  title={Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy.},
  author={Lucille A. Giannuzzi and Daniel Phifer and Nicholas J Giannuzzi and Mario J Capuano},
  journal={Journal of oral and maxillofacial surgery : official journal of the American Association of Oral and Maxillofacial Surgeons},
  year={2007},
  volume={65 4},
  pages={737-47}
}
PURPOSE To assess the usefulness of a dual-beam focused ion beam (FIB) and scanning electron microscope (SEM) instrument and FIB-based transmission electron microscopy (TEM) specimen preparation techniques to characterize bone/dental implant interfaces. MATERIALS AND METHODS The FIB was used to site specifically polished cross-sections for direct FIB, SEM, and TEM imaging of bone osseointegration into a Nobel Biocare TiUnite failed dental implant (Nobel Biocare, Yorba Linda, CA). RESULTS… CONTINUE READING

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