Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser.

Abstract

We present Kikuchi patterns of Si single crystals measured with an electrostatic analyser, where the kinetic energy of the diffracted electron is known with sub-eV precision. Two-dimensional patterns are acquired by rotating the crystal under computer control. This makes detailed comparison of calculated and measured distributions possible with precise… (More)
DOI: 10.1016/j.ultramic.2016.08.015

Topics

Cite this paper

@article{Vos2016TwodimensionalKP, title={Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser.}, author={Maarten De Vos and A Winkelmann}, journal={Ultramicroscopy}, year={2016}, volume={171}, pages={19-25} }