Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

@article{Liang2002TwoDimensionalTD,
  title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST},
  author={Huaguo Liang and Sybille Hellebrand and Hans-Joachim Wunderlich},
  journal={J. Electronic Testing},
  year={2002},
  volume={18},
  pages={159-170}
}
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