Tutorial Review: X-ray Mapping in Electron-Beam Instruments

  title={Tutorial Review: X-ray Mapping in Electron-Beam Instruments},
  author={J. Friel and C. Lyman},
  journal={Microscopy and Microanalysis},
  pages={2 - 25}
This review traces the development of X-ray mapping from its beginning 50 years ago through current analysis procedures that can reveal otherwise obscure elemental distributions and associations. X-ray mapping or compositional imaging of elemental distributions is one of the major capabilities of electron beam microanalysis because it frees the operator from the necessity of making decisions about which image features contain elements of interest. Elements in unexpected locations, or in… Expand
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The New X-ray Mapping: X-ray Spectrum Imaging above 100 kHz Output Count Rate with the Silicon Drift Detector
  • D. Newbury
  • Physics, Medicine
  • Microscopy and Microanalysis
  • 2006
Applications to alloy and rock microstructures, ultrapure materials with rare inclusions, and aggregate particles with complex chemistry illustrate new approaches to characterization made practical by high-speed X-ray mapping with the silicon drift detector. Expand
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Atomic-level detection by X-ray microanalysis in the analytical electron microscope
Abstract Experimental measurements and calculations have demonstrated the detecton of 2 atoms, and the feasibility of detecting single atoms, in the analysis volume of thin specimens using X-rayExpand