Turning liabilities into assets: Exploiting deep submicron CMOS technology to design secure embedded circuits

@article{Schaumont2008TurningLI,
  title={Turning liabilities into assets: Exploiting deep submicron CMOS technology to design secure embedded circuits},
  author={Patrick Schaumont and David D. Hwang},
  journal={2008 IEEE International Symposium on Circuits and Systems},
  year={2008},
  pages={3178-3181}
}
This paper explores an unexpected link between system-level security considerations and deep-submicron CMOS circuits. Many deep-submicron effects including increased leakage power, process variability, noise-level, power- density and integration density are thought of to be liabilities for integrated design. However, we show how they may instead be an asset… CONTINUE READING