## Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-<formula formulatype="inline"><tex Notation="TeX">$k$</tex></formula> Gated MOSFETs by a Modified Charge Pumping Technique

- Chun-Chang Lu, Kuei-Shu Chang-Liao, Che-Hao Tsao, Tien-Ko Wang, Hsueh-Chao Ko, Yao-Tung Hsu
- IEEE Transactions on Electron Devices
- 2014