Tuning the graphene work function by electric field effect.

@article{Yu2009TuningTG,
  title={Tuning the graphene work function by electric field effect.},
  author={Young-jun Yu and Yue Zhao and Sunmin Ryu and Louis E Brus and K. S. Kim and Philip Kim},
  journal={Nano letters},
  year={2009},
  volume={9 10},
  pages={3430-4}
}
We report variation of the work function for single and bilayer graphene devices measured by scanning Kelvin probe microscopy (SKPM). By use of the electric field effect, the work function of graphene can be adjusted as the gate voltage tunes the Fermi level across the charge neutrality point. Upon biasing the device, the surface potential map obtained by SKPM provides a reliable way to measure the contact resistance of individual electrodes contacting graphene. 
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Calibration of SKPM probe with HOPG In Fig.S3, the contact potential differences (VCPD) between gold coated SKPM probes and highly oriented pyrolytic graphite

T. Takahashi, H. Tokailin, T. Sagawa
Phys. Rev. B • 2000

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