Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits

@article{Zhou2008TunableTF,
  title={Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits},
  author={Quming Zhou and Mihir R. Choudhury and Kartik Mohanram},
  journal={2008 13th European Test Symposium},
  year={2008},
  pages={179-184}
}
This paper describes a tunable transient filter (TTF) design for soft error rate reduction in combinational logic circuits. TTFs can be inserted into combinational circuits to suppress propagated single- event upsets (SEUs) before they can be captured in latches/flip- flops. TTFs are tuned by adjusting the maximum width of the propagated SEU that can be suppressed. TTFs require 6-14 transistors, making them an attractive cost-effective option to reduce the soft error rate in combinational… CONTINUE READING
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