Trends in testing integrated circuits

@article{Vermeulen2004TrendsIT,
  title={Trends in testing integrated circuits},
  author={B. Vermeulen and C. Hora and B. Kruseman and E. Marinissen and R. V. Rijsinge},
  journal={2004 International Conferce on Test},
  year={2004},
  pages={688-697}
}
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips. 
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