Trapped-ion probing of light-induced charging effects on dielectrics

@article{Harlander2010TrappedionPO,
  title={Trapped-ion probing of light-induced charging effects on dielectrics},
  author={Maximilian Harlander and Michael Brownnutt and Wolfgang Hansel and Rainer Blatt},
  journal={New Journal of Physics},
  year={2010},
  volume={12},
  pages={093035}
}
  • Maximilian Harlander, Michael Brownnutt, +1 author Rainer Blatt
  • Published 2010
  • Physics
  • New Journal of Physics
  • We use a string of confined 40Ca+ ions to measure perturbations to a trapping potential which are caused by the light-induced charging of an antireflection-coated window and of insulating patches on the ion-trap electrodes. The electric fields induced at the ions' position are characterized as a function of distance to the dielectric and as a function of the incident optical power and wavelength. The measurement of the ion-string position is sensitive to as few as 40 elementary charges per on… CONTINUE READING

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