Transistor Count, Chip Area and Cost Optimization of Fault Tolerant Active Pixel Sensors (FTAPS) by Modified Sensor Architecture and T-spice Based Verification of Proposed Architecture

  • Debapriyo Ghosh
  • Published 2010 in
    2010 International Conference on Recent Trends in…

Abstract

Pixel defects are unavoidable in many solid-state image sensors, especially, CMOS image sensors. The pixel defects includes Hot pixels, Partially-stuck pixels, Fully-stuck pixels, Abnormal sensitivity defects, Random Telegraph Signal defects. Among them the most common and significant is hot pixel defect. Many approaches have been proposed to counter the… (More)

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Cite this paper

@article{Ghosh2010TransistorCC, title={Transistor Count, Chip Area and Cost Optimization of Fault Tolerant Active Pixel Sensors (FTAPS) by Modified Sensor Architecture and T-spice Based Verification of Proposed Architecture}, author={Debapriyo Ghosh}, journal={2010 International Conference on Recent Trends in Information, Telecommunication and Computing}, year={2010}, pages={200-202} }