Transient fault characterization in dynamic noisy environments

Abstract

Technology trends are increasing the frequency of serious transient (soft) faults in digital systems. For example, ICs are becoming more susceptible to cosmic radiation, and are being embedded in applications with dynamic noisy environments. We propose a generic framework for representing such faults and characterizing them on-line. We formally define the… (More)
DOI: 10.1109/TEST.2005.1584070

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@article{Polian2005TransientFC, title={Transient fault characterization in dynamic noisy environments}, author={Ilia Polian and John P. Hayes and Sandip Kundu and Bernd Becker}, journal={IEEE International Conference on Test, 2005.}, year={2005}, pages={10 pp.-1048} }