Transient Radar Method: Novel Illumination and Blind Electromagnetic/Geometrical Parameter Extraction Technique for Multilayer Structures

Abstract

A novel technique enabling ultrafast nondestructive characterization of multilayer dielectric structures is proposed. Actual estimations indicate that the data acquisition performance of electronic measurement systems of today allow deep submillimeter depth resolution, almost independently of the frequency. For a 10 GHz signal, e.g., this corresponds to… (More)

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